Multi-Probe System (Dedicated Option for APT-2600FD)
Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.
This is an option that equips the underside operating axis of the APT-1600FD series with a dedicated fixture lifting mechanism. It allows for special inspections connected to external devices, such as Boundary Scan Tests (BST), as well as writing to and reading logs from ICs, to be performed in parallel with in-circuit testing. *For an image of the operation, please refer to the YouTube video.
- 企業：TAKAYA Corporation
- 価格：Other
